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| File | File in archive | Date | Context | Size | DLs | Mfg | Model |
| 5991-2171EN Measuring Dielectric Properties using Keysight_2527s Materials Measurement Solutions - B | 5991-2171EN Measuring Dielectric Properties using Keysight_2527s Materials Measurement Solutions - B | 19/08/21 | Keysight Technologies Measuring Dielectr | 525 kB | 2 | Agilent | 5991-2171EN Measuring Dielectric Properties using Keysight 2527s Materials Measurement Solutions - B |
| 5991-4713EN Materials Measurement_ Dielectric Materials - Application Brief c20140717 [5].pdf | 5991-4713EN Materials Measurement_ Dielectric Materials - Application Brief c20140717 [5].pdf | 13/08/21 | Keysight Technologies Materials Measurem | 935 kB | 1 | Agilent | 5991-4713EN Materials Measurement Dielectric Materials - Application Brief c20140717 [5] |
| 5980-2862EN Solutions for Measuring Permittivity and Permeability w LCR Meters & Impedance Analyzers | 5980-2862EN Solutions for Measuring Permittivity and Permeability w LCR Meters & Impedance Analyzers | 15/09/21 | Keysight Technologies Solutions for Meas | 718 kB | 4 | Agilent | 5980-2862EN Solutions for Measuring Permittivity and Permeability w LCR Meters & Impedance Analyzers |
| 5991-4715EN English _ 2014-08-27 _ PDF 227 KB c20141007 [4].pdf | 5991-4715EN English _ 2014-08-27 _ PDF 227 KB c20141007 [4].pdf | 24/12/19 | Keysight Technologies Materials Measurem | 227 kB | 2 | Agilent | 5991-4715EN English 2014-08-27 PDF 227 KB c20141007 [4] |
| 5989-2589EN English _ 2014-05-16 _ PDF 3.32 MB c20140728 [34].pdf | 5989-2589EN English _ 2014-05-16 _ PDF 3.32 MB c20140728 [34].pdf | 31/08/20 | Keysight Technologies Basics of Measurin | 2840 kB | 1 | Agilent | 5989-2589EN English 2014-05-16 PDF 3.32 MB c20140728 [34] |
| 5980-2862EN.pdf | 5980-2862EN.pdf | 22/03/20 | Agilent Solutions for Measuring Permitti | 1536 kB | 3 | HP | 5980-2862EN |
| E5500 Series Phase Noise Measurement Solutions - Configuration Guide 5988-9891EN c20140616 [6].pdf | E5500 Series Phase Noise Measurement Solutions - Configuration Guide 5988-9891EN c20140616 [6].pdf | 09/08/21 | Keysight Technologies E5500 Series Phase | 557 kB | 1 | Agilent | E5500 Series Phase Noise Measurement Solutions - Configuration Guide 5988-9891EN c20140616 [6] |
| 5990-7534EN Paving the Way for Research and Innovations - Brochure c20140829 [19].pdf | 5990-7534EN Paving the Way for Research and Innovations - Brochure c20140829 [19].pdf | 31/08/20 | Keysight Technologies Paving the Way for | 1038 kB | 1 | Agilent | 5990-7534EN Paving the Way for Research and Innovations - Brochure c20140829 [19] |
| 5991-4716EN Materials Measurement_ Phantoms - Application Brief c20140717 [4].pdf | 5991-4716EN Materials Measurement_ Phantoms - Application Brief c20140717 [4].pdf | 29/08/20 | Keysight Technologies Materials Measurem | 824 kB | 1 | Agilent | 5991-4716EN Materials Measurement Phantoms - Application Brief c20140717 [4] |
| 5952-1430E LCR Meters_252C Impedance Analyzers and Test Fixtures Selection Guide c20141028 [15].pdf | 5952-1430E LCR Meters_252C Impedance Analyzers and Test Fixtures Selection Guide c20141028 [15].pdf | 29/06/21 | Keysight Technologies LCR Meters, Impeda | 720 kB | 8 | Agilent | 5952-1430E LCR Meters 252C Impedance Analyzers and Test Fixtures Selection Guide c20141028 [15] |
| Scanning Microwave Microscope Mode - Application Note 5989-8818EN c20141205 [6].pdf | Scanning Microwave Microscope Mode - Application Note 5989-8818EN c20141205 [6].pdf | 29/08/20 | Keysight Technologies Scanning Microwave | 320 kB | 1 | Agilent | Scanning Microwave Microscope Mode - Application Note 5989-8818EN c20141205 [6] |
| Mechanical Properties Measurement on Individual Composite Micro-fibers - Application Note 5991-4027E | Mechanical Properties Measurement on Individual Composite Micro-fibers - Application Note 5991-4027E | 05/06/21 | Keysight Technologies Mechanical Propert | 144 kB | 2 | Agilent | Mechanical Properties Measurement on Individual Composite Micro-fibers - Application Note 5991-4027E |
| 5991-4739EN Materials Measurement_ Liquid Materials - Application Brief c20140805 [6].pdf | 5991-4739EN Materials Measurement_ Liquid Materials - Application Brief c20140805 [6].pdf | 28/08/20 | Keysight Technologies Materials Measurem | 1274 kB | 2 | Agilent | 5991-4739EN Materials Measurement Liquid Materials - Application Brief c20140805 [6] |
| 5991-4714EN Materials Measurement_ Magnetic Materials - Application Brief c20140717 [5].pdf | 5991-4714EN Materials Measurement_ Magnetic Materials - Application Brief c20140717 [5].pdf | 22/11/21 | Keysight Technologies Materials Measurem | 1114 kB | 1 | Agilent | 5991-4714EN Materials Measurement Magnetic Materials - Application Brief c20140717 [5] |
| 5990-3672EN Keysight Pulsed-IV Parametric Test Solution - Selection Guide c20140829 [12].pdf | 5990-3672EN Keysight Pulsed-IV Parametric Test Solution - Selection Guide c20140829 [12].pdf | 04/12/21 | Keysight Technologies Pulsed-IV Parametr | 645 kB | 1 | Agilent | 5990-3672EN Keysight Pulsed-IV Parametric Test Solution - Selection Guide c20140829 [12] |
| 5990-5976EN Keysight Technologies_ Powering the Solar Revolution - Brochure c20140903 [6].pdf | 5990-5976EN Keysight Technologies_ Powering the Solar Revolution - Brochure c20140903 [6].pdf | 09/06/21 | Keysight Technologies Powering the Solar | 584 kB | 19 | Agilent | 5990-5976EN Keysight Technologies Powering the Solar Revolution - Brochure c20140903 [6] |
| 5991-2907EN Electromagnetic Simulations at the Nanoscale_ EMPro Modeling and Comparison to SMM Exper | 5991-2907EN Electromagnetic Simulations at the Nanoscale_ EMPro Modeling and Comparison to SMM Exper | 03/08/21 | Keysight Technologies Electromagnetic Si | 2514 kB | 9 | Agilent | 5991-2907EN Electromagnetic Simulations at the Nanoscale EMPro Modeling and Comparison to SMM Exper |
| santa_rosa_brochure Keysight in Santa Rosa_252C California c20141015 [5].pdf | santa_rosa_brochure Keysight in Santa Rosa_252C California c20141015 [5].pdf | 31/08/20 | Keysight in Santa Rosa, CA Today's w | 707 kB | 1 | Agilent | santa rosa brochure Keysight in Santa Rosa 252C California c20141015 [5] |
| 5991-3930EN Single Source Solution Plans - Product Fact Sheet c20140915 [2].pdf | 5991-3930EN Single Source Solution Plans - Product Fact Sheet c20140915 [2].pdf | 29/01/20 | Keysight Single Source Solution Plans Ma | 159 kB | 1 | Agilent | 5991-3930EN Single Source Solution Plans - Product Fact Sheet c20140915 [2] |
| Tips for Querying CW and Average Power Without Compromising Measurement Accuracy - Application Brief | Tips for Querying CW and Average Power Without Compromising Measurement Accuracy - Application Brief | 25/08/21 | Keysight Technologies Tips for Querying | 558 kB | 3 | Agilent | Tips for Querying CW and Average Power Without Compromising Measurement Accuracy - Application Brief |